ICST is 10 years old! Come join us to celebrate this important milestone for the most prestigious event in our field of Software Testing, Verification and Validation. ICST 2017 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of Software Testing, Verification and Validation. ICST 2017 will include keynote addresses by eminent scientists as well as special, regular and poster sessions. All research papers will be peer reviewed on the basis of a full length manuscript and acceptance will be based on quality, originality and relevance. Accepted research papers will be published in the conference proceedings with an IEEE catalog number and ISBN number. The proceedings will be submitted for publication in IEEE Xplore. By including poster sessions, workshops, tutorials, PhD symposium, contest on bug finding, tool demonstrations, talks, and social events, ICST 2017 promises to help ensure an environment that stimulates learning and collaboration.

Yokoso! We welcome you all to Tokyo. ICST 2017 will be held from March 13 to 17, 2017 in beautiful and impressive Tokyo, Japan. Please mark your calendars for ICST 2017 Tokyo. In 2014, Tokyo was ranked first in the "Best overall experience" category of TripAdvisor's World City Survey. The city also ranked first in the categories: Helpfulness of locals, Nightlife, Shopping, Local public transportation and Cleanliness of streets. The Michelin Guide has awarded Tokyo by far the most Michelin stars of any city in the world. Tokyo has plenty of cultural and exciting places such as museums, the sumo wrestling arena, the kabuki theater, and Akihabara town.

In Tokyo, you can find plenty of high-class and reasonably priced restaurants. If you have any problem in Tokyo, do not worry, people of Tokyo are courteous and kind. Tokyo promises you many exciting and heart-warming experiences.

Please refer to the Official Website for more information.